This is a SPM instrument suitable for both teaching and scientific research. The machine integrates the contact mode and lateral force working mode of scanning tunneling microscope and atomic force microscope; it can realize the nano-scale morphology characterization and film of various materials samples such as film and block analysis. If you need to detect soft, easily adhered samples such as powders, solutions, fibers, biological samples, etc., please purchase the ZL AFM-III scanning probe microscope equipped with AFM tapping mode. For the principle details, please refer to the relevant content in "Understanding the Module".
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